J-1A JEOL SEM Specimen Mounts are designed for use with scanning electron microscopes (SEMs) from JEOL for instruments that are 1/2″ (12.5mm) O.D. x 1/4″ (5mm) high. These mounts are used to hold and secure the specimen in place during the SEM imaging process. They are made from high-quality materials to ensure stable and consistent performance during the imaging process. The J-1A mounts are compatible with a variety of SEM models and have a standard diameter of 30mm, making them suitable for a wide range of applications. They are easy to install and use, making them a convenient and reliable choice for those working with SEMs.
Larger package quantities available, upon request. Contact Energy Beam Sciences at email@example.com 800-992-9037,for a quote.